(eBook/PDF) Experimental Studies Of Electromigration In Advanced Interconnect Systems For Future Ulsi Technology Online

Language: en
Pages: 290

Experimental Studies of Electromigration in Advanced Interconnect Systems for Future ULSI Technology

Authors: Richard Frankovic

Categories:

Type: BOOK - Published: 1996 - Publisher:

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Language: en
Pages: 312

Electromigration in ULSI Interconnections

Authors: Cher Ming Tan

Categories: Computers

Type: BOOK - Published: 2010 - Publisher: World Scientific

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Electromigration in ULSI Interconnections provides a comprehensive description of the electro migration in integrated circuits. It is intended for both beginner

Language: en
Pages: 312

Electromigration In Ulsi Interconnections

Authors: Cher Ming Tan

Categories: Technology & Engineering

Type: BOOK - Published: 2010-06-25 - Publisher: World Scientific

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Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner