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Language: en
Pages: 634
Pages: 634
Type: BOOK - Published: 2013-01-01 - Publisher: ASM International
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide
Language: en
Pages:
Pages:
Type: BOOK - Published: 2018-12-01 - Publisher: ASM International
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to Novembe
Language: en
Pages: 540
Pages: 540
Type: BOOK - Published: 2019-12-01 - Publisher: ASM International
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of
Language: en
Pages: 562
Pages: 562
Type: BOOK - Published: 2014-11-01 - Publisher: ASM International
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the s
Language: en
Pages: 750
Pages: 750
Type: BOOK - Published: 2019-11-01 - Publisher: ASM International
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM I
