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Language: en
Pages: 522
Authors: Peter W. Epperlein
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Type: BOOK - Published: 2013-01-25 - Publisher: John Wiley & Sons

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This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressin
Semiconductor Laser Engineering, Reliability and Diagnostics
Language: en
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This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressin
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Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for lin
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Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapter
Integrated Photonics for Data Communication Applications
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Integrated Photonics for Data Communications Applications reviews the key concepts, design principles, performance metrics and manufacturing processes from adva