This volume contains original and refereed contributions from the tenth AMCTM Conference (http://www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in Sept
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and test
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathemat