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Language: en
Pages: 431
Pages: 431
Type: BOOK - Published: 2013-11-11 - Publisher: Springer Science & Business Media
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1
Language: en
Pages: 468
Pages: 468
Type: BOOK - Published: 1994 - Publisher: Springer Science & Business Media
Papers presented at the first US Army Natick Research, Development and Engineering Center Symposium on [title], held in Natick, Mass., June 1993. The various sy
Language: en
Pages: 359
Pages: 359
Type: BOOK - Published: 2013-03-08 - Publisher: Springer Science & Business Media
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications
Language: en
Pages: 243
Pages: 243
Type: BOOK - Published: 2013-06-29 - Publisher: Springer Science & Business Media
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to
Language: en
Pages: 335
Pages: 335
Type: BOOK - Published: 2008-09-26 - Publisher: John Wiley & Sons
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to e
