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Direct Profiling of III/V Semiconductor Nanostructures at the Atomic Level by Cross-sectional Scanning Tunneling Microscopy
Language: en
Pages: 119
Atomic Scale Images of Acceptors in III-V Semiconductors
Language: en
Pages: 189
Authors: Sebastian Loth
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Type: BOOK - Published: 2008 - Publisher: Universitätsverlag Göttingen

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Study of III-V Semiconductor Nanostructures by Cross-sectional Scanning Tunneling Microscopy
Language: en
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Type: BOOK - Published: 2005 - Publisher:

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Scanning Tunneling Microscopy Studies of Nano-scale Properties of III/V Semiconductor Heterostructures
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Surface Modification of III-V Nanostructures Studied by Low-temperature Scanning Tunneling Microscopy
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Authors: Yi Liu
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Type: BOOK - Published: 2022 - Publisher:

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In the past decade, driven by the demand for materials with high performance for next-generation semiconductor devices (e.g., for quantum computing), the explor