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Impact of Electron and Scanning Probe Microscopy on Materials Research
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Pages: 503
Authors: David G. Rickerby
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Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines
Advances in Scanning Probe Microscopy
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Authors: T. Sakurai
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There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. He
Scanning Probe Microscopy
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Type: BOOK - Published: 2007-04-03 - Publisher: Springer Science & Business Media

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This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing
Scanning Probe Microscopy
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Authors: Bert Voigtländer
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Type: BOOK - Published: 2015-02-24 - Publisher: Springer

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This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operat
Applied Scanning Probe Methods III
Language: en
Pages: 414
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-28 - Publisher: Springer Science & Business Media

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The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre-