On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE

On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
Author :
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Total Pages : 229
Release :
ISBN-10 : 0769519687
ISBN-13 : 9780769519685
Rating : 4/5 (87 Downloads)

Book Synopsis On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE by : C. Metra

Download or read book On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE written by C. Metra and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2003 with total page 229 pages. Available in PDF, EPUB and Kindle. Book excerpt:


On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE Related Books

On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
Language: en
Pages: 229
Authors: C. Metra
Categories: Electronic circuit design
Type: BOOK - Published: 2003 - Publisher: Institute of Electrical & Electronics Engineers(IEEE)

DOWNLOAD EBOOK

Design and Test Technology for Dependable Systems-on-chip
Language: en
Pages: 550
Authors: Raimund Ubar
Categories: Computers
Type: BOOK - Published: 2011-01-01 - Publisher: IGI Global

DOWNLOAD EBOOK

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circui
Embedded Processor-Based Self-Test
Language: en
Pages: 226
Authors: Dimitris Gizopoulos
Categories: Computers
Type: BOOK - Published: 2013-03-09 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on
Systems Engineering for Microscale and Nanoscale Technologies
Language: en
Pages: 592
Authors: M. Ann Garrison Darrin
Categories: Technology & Engineering
Type: BOOK - Published: 2016-04-19 - Publisher: CRC Press

DOWNLOAD EBOOK

To realize the full potential of micro- and nanoscale devices in system building, it is critical to develop systems engineering methodologies that successfully
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Language: en
Pages: 210
Authors: Zheng Wang
Categories: Technology & Engineering
Type: BOOK - Published: 2017-06-23 - Publisher: Springer

DOWNLOAD EBOOK

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design ab