Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV
| Author | : Sharad Prasad |
| Publisher | : Society of Photo Optical |
| Total Pages | : 240 |
| Release | : 1998 |
| ISBN-10 | : 0819429694 |
| ISBN-13 | : 9780819429698 |
| Rating | : 4/5 (94 Downloads) |
Book Synopsis Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV by : Sharad Prasad
Download or read book Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV written by Sharad Prasad and published by Society of Photo Optical. This book was released on 1998 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.
