Power Integrity for I/O Interfaces
Author | : Vishram Shriram Pandit |
Publisher | : Pearson Education |
Total Pages | : 0 |
Release | : 2011 |
ISBN-10 | : 0137011199 |
ISBN-13 | : 9780137011193 |
Rating | : 4/5 (99 Downloads) |
Download or read book Power Integrity for I/O Interfaces written by Vishram Shriram Pandit and published by Pearson Education. This book was released on 2011 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Foreword by Joungho Kim The Hands-On Guide to Power Integrity in Advanced Applications, from Three Industry Experts In this book, three industry experts introduce state-of-the-art power integrity design techniques for today's most advanced digital systems, with real-life, system-level examples. They introduce a powerful approach to unifying power and signal integrity design that can identify signal impediments earlier, reducing cost and improving reliability. After introducing high-speed, single-ended and differential I/O interfaces, the authors describe on-chip, package, and PCB power distribution networks (PDNs) and signal networks, carefully reviewing their interactions. Next, they walk through end-to-end PDN and signal network design in frequency domain, addressing crucial parameters such as self and transfer impedance. They thoroughly address modeling and characterization of on-chip components of PDNs and signal networks, evaluation of power-to-signal coupling coefficients, analysis of Simultaneous Switching Output (SSO) noise, and many other topics. Coverage includes * The exponentially growing challenge of I/O power integrity in high-speed digital systems * PDN noise analysis and its timing impact for single-ended and differential interfaces * Concurrent design and co-simulation techniques for evaluating all power integrity effects on signal integrity * Time domain gauges for designing and optimizing components and systems * Power/signal integrity interaction mechanisms, including power noise coupling onto signal trace and noise amplification through signal resonance * Performance impact due to Inter Symbol Interference (ISI), crosstalk, and SSO noise, as well as their interactions * Validation techniques, including low impedance VNA measurements, power noise measurements, and characterization of power-to-signal coupling effects Power Integrity for I/O Interfaces will be an indispensable resource for everyone concerned with power integrity in cutting-edge digital designs, including system design and hardware engineers, signal and power integrity engineers, graduate students, and researchers.