CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Author | : Andrei Pavlov |
Publisher | : Springer Science & Business Media |
Total Pages | : 203 |
Release | : 2008-06-01 |
ISBN-10 | : 9781402083631 |
ISBN-13 | : 1402083637 |
Rating | : 4/5 (31 Downloads) |
Book Synopsis CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies by : Andrei Pavlov
Download or read book CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies written by Andrei Pavlov and published by Springer Science & Business Media. This book was released on 2008-06-01 with total page 203 pages. Available in PDF, EPUB and Kindle. Book excerpt: The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.