Study of Performance and Reliability in GaN on Si Power Devices: Impacts of Oxygen Plasma in P-GaN HEMTs and Trench Processes in Schottky Barrier Diode
Author | : |
Publisher | : |
Total Pages | : 0 |
Release | : 2022 |
ISBN-10 | : OCLC:1413737799 |
ISBN-13 | : |
Rating | : 4/5 (99 Downloads) |
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