Development and Optimization of a Scanning Near-field Optical Microscope

Development and Optimization of a Scanning Near-field Optical Microscope
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Download or read book Development and Optimization of a Scanning Near-field Optical Microscope written by and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: "Scanning near-field optical microscopy (SNOM) is a technique of imaging used for mapping optical near-field signals by detecting evanescent waves, enabling a resolution beyond the diffraction limit, i.e., a lateral and vertical resolution much smaller than the operation wavelength. SNOM has the ability to measure both optical and topographic data in a single scan. In this thesis, we propose the development and optimization of a low-cost SNOM capable of measuring nanoscale topographies and near-field optical signals, such as surface plasmon polaritons. The SNOM uses a shear-force feedback control to set the distance between the probe and the sample (∼ 20 nm) along the entire scan.The results obtained include a stable control system with fast response. The system can provide precise quantitative topographic and optical measurements. Also, an optical method for distance and displacement measurements of the probe-sample separation was developed. "--Resumen hoja v.


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