Functional and Pattern Sensitive Fault Testing Algorithms for Semiconductor Random Access Memories
Author | : Dong Sung Suk |
Publisher | : |
Total Pages | : 178 |
Release | : 1978 |
ISBN-10 | : OCLC:148496295 |
ISBN-13 | : |
Rating | : 4/5 (95 Downloads) |
Book Synopsis Functional and Pattern Sensitive Fault Testing Algorithms for Semiconductor Random Access Memories by : Dong Sung Suk
Download or read book Functional and Pattern Sensitive Fault Testing Algorithms for Semiconductor Random Access Memories written by Dong Sung Suk and published by . This book was released on 1978 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt: