Reliability and Failure Mechanisms of GaN HEMT Devices Suitable for High-frequency and High-power Applications
| Author | : Antonio Stocco |
| Publisher | : |
| Total Pages | : |
| Release | : 2012 |
| ISBN-10 | : OCLC:955195014 |
| ISBN-13 | : |
| Rating | : 4/5 (14 Downloads) |
Book Synopsis Reliability and Failure Mechanisms of GaN HEMT Devices Suitable for High-frequency and High-power Applications by : Antonio Stocco
Download or read book Reliability and Failure Mechanisms of GaN HEMT Devices Suitable for High-frequency and High-power Applications written by Antonio Stocco and published by . This book was released on 2012 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
