Download or read book Reliability Prediction Models for Microwave Solid State Devices written by George F. Guth and published by . This book was released on 1979 with total page 107 pages. Available in PDF, EPUB and Kindle. Book excerpt: Martin Marietta Corporation conducted a 12 month program to develop base failure rates and failure rate mathematical models for microwave solid state devices. These models are provided in the format of MIL-HDBK-217B. More than 8.75 billion part hours of operating field data were collected from industrial and Government data sources. Data were analyzed and sorted manually. Conclusions are summarized in the revised base failure rates and mathematical models described. Failure rates developed for those devices already included in MIL-HDBK-217B are compared with present failure rates. Devices not presently included in MIL-HDBK-217B are listed with new pages for inclusion in MIL-HDBK-217B. (Author).